Memory Test; Pin Driver Clock Test; Programmable Supply Voltage Loop - Xilinx HW-130 User Manual

Memory Test

This test writes a non-repeating data pattern to the HW-130
Programmer data memory to ensure that every bit location can be
accessed and that both a logic "1" and "0" can be written and read.
Each time you complete a test, you are informed whether the test was
successful or not. If the test fails, the Diagnostics Status box also
displays which memory bank failed.

Pin Driver Clock Test

The Pin Driver test exercises every address, data, and clock signal
that connects to the socket adapter interface connector.
1. To use this test, install a socket adapter with no device in the
2. Select Pin Driver Clock Test from the Options Diagnostics
3. Click on Execute.
Note: To stop the test, click on Cancel.
The address, data, and clock signals are driven between a CMOS
logic "0" and "1" at approximately 36 kHz. You can view them using
an oscilloscope to probe the appropriate pins of the adapter socket.
Refer to the device data sheet for pin-out information. There are no
Pass/Fail conditions for this test.
Warning: Exercise caution when probing the socket pins to avoid
damaging them.
When you use the calibration adapter shown in Figure B-1, signals
are connected such that the HW-130 Programmer is able to test all the
pins as both input and output signals. The programmer will display
any errors that occur and continuously toggle all the signals at the
approximate rate of 36 KHz.

Programmable Supply Voltage Loop

The HW-130 Programmer has two programmable power supplies
called PVcc and PVpp, which are used to program devices.
1. To use this test, install a socket adapter with no device in the
HW-130 Programmer User Guide
socket.
menu.
Diagnostics Procedures
B-5