Nx64 Kbit/S Testing - VeEX MTT-14B User Manual

MTT-14B e_Manual D07-00-083P RevA00

3.9 Nx64 kbit/s Testing

Fractional E1 circuits are circuits of data rate Nx64 kbit/s, where
N can be anywhere from 1 to 31 channels. N channels of the E1
line are dedicated to the fractional E1 circuit, and the remaining
channels of the E1 line are either filled with an idle code, other
revenue traffic or framing information.
Use the following procedure:
1. Verify that the fractional circuit is not in service. This test will
disrupt service.
2. From the module main menu, select TEST CONFIGURATION
and configure as follows:
MODE: STUC E1, STUR E1, or E1
Tx SOURCE: TESTPAT
FRAMING: As specified by the circuit design.
CRC-4: As specified by the circuit design.
TEST RATE: Nx64K, the fractional SELECT TIME SLOT screen
is displayed. Manually configure the timeslots or press AUTO.
If needed, see Section 2.3.3.
Rx PORT: TERM
TX CLOCK: INTERN
Press ENTER when configured.
Note: AUTO configuration may not yield proper channels if
any of the active channels are transmitting an idle code.
3. Connect the test set to the circuit as shown in Figure 48.
4. Ensure that a loop is in place at the far end of the circuit.
5. Press HISTORY to acknowledge any blinking LEDs.
6. Select MEASUREMENT RESULTS and press START (F3) to
perform the acceptance test and verify the fractional service
performs to your company's requirements for the service
delivered.
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