Measurement Definitions - VeEX MTT-14B User Manual

MTT-14B e_Manual D07-00-083P RevA00 Page 55 of 101

2.3.3.1 Measurement Definitions

The following measurements are displayed within the results screens.
The definitions are listed in alphabetical order. Each measurement is
proprietary to its screen; i.e., 'error' refers to E-Bit errors in the E-BIT
screen, and to all Summary errors in the SUMMARY screen.
AISS: Count of the number of Alarm Indication Signal Seconds.
AS: Count of Available Seconds since the start of the test. It equals
the length of the total test time minus any Unavailable Seconds.
%AS: Percentage of Available Seconds since the start of the test.
BIT: Count of Bit errors since the start of the test. Bit errors are
not counted during unavailable time.
BER: Bit Error Rate is the total number of bit errors divided by
the total number of bits during the available time since the start
of the test.
CLK SLIP: Number of Clock Slips since the start of the test.
CODE: Count of the number of line Code errors (Bipolar Violations
that violate the coding rules) since the start of the test. This is mea-
sured only in E1 mode. In HDB3 coding, a Code Error is a bipolar
violation that is not part of a valid HDB3 substitution. CODE RATE is
the Average Bipolar Violation error rate since the start of the test.
CRC: Count of the number of CRC-4 block errors since the start of
the test. N/A is displayed when the test set is not synchronized on a
received CRC-4 check sequence. CRC RATE is the average CRC-4
block error rate since the start of the test. N/A is displayed when the
test set is not synchronized on a received FAS or MFAS signal.
DGRM: Count of Degraded Minutes since the start of the test.
This occurs when there is a 10 -6
bit error rate during 60 available,
non-severely bit errored seconds.
%DGRM: Percentage of summary Degraded Minutes since the
start of the test.
EBIT: Number of E-bit errors since the start of the test.
EBER: Average E-bit error rate since the start of the test.
EFS: Number of Error Free Seconds since the start of the test.
%EFS: Percentage of summary Error Free Seconds since the start
of the test. A summary Error Free Second is a second in which the
signal is properly synchronized and no errors or defects occur.
ES: Count of the number of Errored Seconds since the start of the
test. An ES is any second with at least one BPV, bit error, FBE, er-
rored block, or CRC-4 error. An ES is not counted during a UAS.
%ES: Percentage of errored seconds since the start of the test.