Stuc E1, Stur E1, And E1 Configuration; Rx Port; Tx Clock; Tx Source - VeEX MTT-14B User Manual

MTT-14B e_Manual D07-00-083P RevA00

2.3 STUC E1, STUR E1, and E1 Configuration

08:39:57
>LINK DN- Idle STU-C E1<
TEST CONFIGURATION
MODE : STUC-E1
TX SOURCE : TESTPAT
FRAMING : PCM-30
CRC-4 : YES
TEST RATE : 2.048M

RX PORT

: TERM

TX CLOCK

: INTERN
STU-C STU-R STUC-E1 more
08:39:57
>LINK DN- Idle
TEST CONFIGURATION
MODE
TX SOURCE : TESTPAT
FRAMING
CRC-4
TEST RATE : 2.048M
RX PORT
TX CLOCK
STUR E1
Figure 28 STUx E1 and E1 Configuration Screens
Configure the following:

TX SOURCE

Options: TESTPAT (F1), LOOP (F2)
• TESTPAT: Use for out-of-service bit error rate testing. In this
case, a test pattern will be transmitted on the selected Transmit
jack. During Nx64K testing, an idle code will be inserted on
the unused channels.
• LOOP: Use for full duplex drop and insert testing on an in-
service line. In this case, the signal received on the Rx jack
will be transmitted out the Tx jack.
FRAMING
Options: PCM-30 (F1), PCM-31 (F2), UNFRAME (F3)
Choose the appropriate framing for the circuit under test.
• PCM-30: The test set will synchronize on both FAS (Frame
Alignment Signal) and MFAS (MultiFrame Alignment Signal).
• PCM-31: The test set will synchronize only on FAS.
• UNFRAME: Framing is not used.
Notes:
• If unsure of the framing, press AUTO. Use the combination which
synchronizes properly and/or allows error free measurements.
08:39:57
>LINK DN- Idle
TEST CONFIGURATION
MODE : STUR-E1
TX SOURCE : TESTPAT
FRAMING : PCM-30
CRC-4 : YES
TEST RATE : 2.048M
RX PORT : TERM
TX CLOCK : INTERN
STUR E1 E1
STU-R E1<
: E1
: PCM-30
: YES
: TERM
: INTERN
E1 more
STU-R E1<
more
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