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Electrical characteristics
6.3.3
Embedded internal reference voltage
The parameters given in
specified.
Table 12.
Embedded internal reference voltage
Symbol
(1)
V
Internal reference voltage
REFINT out
Internal reference current
I
REFINT
consumption
T
Internal reference startup time
VREFINT
V
DDA
V
VREF_MEAS
V
REFINT
Accuracy of factory-measured
A
VREF_MEAS
V
REF
(3)
T
Temperature coefficient
Coeff
(3)
A
Long-term stability
Coeff
(3)
VDDCoeff
Voltage coefficient
ADC sampling time when
(3)(4)
T
reading the internal reference
S_vrefint
voltage
Startup time of reference voltage
(3)
T
ADC_BUF
buffer for ADC
Consumption of reference
(3)
I
BUF_ADC
voltage buffer for ADC
(3)
I
VREF_OUT output current
VREF_OUT
(3)
C
VREF_OUT output load
VREF_OUT
Consumption of reference
(3)
I
voltage buffer for VREF_OUT
LPBUF
and COMP
(3)
V
1/4 reference voltage
REFINT_DIV1
(3)
V
1/2 reference voltage
REFINT_DIV2
(3)
V
3/4 reference voltage
REFINT_DIV3
1. Tested in production;
2. The internal V
value is individually measured in production and stored in dedicated EEPROM bytes.
REF
3. Guaranteed by design, not tested in production.
4. Shortest sampling time can be determined in the application by multiple iterations.
5. To guarantee less than 1% VREF_OUT deviation.
48/109
Table 12
Parameter
and V
voltage during
REF+
factory measure
(2)
value
(5)
Doc ID 17659 Rev 6
are based on characterization results, unless otherwise
Conditions
– 40 °C < T
< +105 °C
J
Including uncertainties
due to ADC and
V
/V
values
DDA
REF+
–40 °C < T
< +105 °C
J
0 °C < T
< +50 °C
J
1000 hours, T= 25 °C
3.0 V < V
< 3.6 V
DDA
STM32L151xx, STM32L152xx
Min
Max
Typ
1.202
1.224
1.242
1.4
2.3
2
3
2.99
3
3.01
±5
20
50
20
1000
2000
5
10
10
13.5
25
1
50
730
1200
24
25
26
49
50
51
74
75
76
Unit
V
µA
ms
V
mV
ppm/°C
ppm
ppm/V
µs
µs
µA
µA
pF
nA
%
V
REFINT
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