STMicroelectronics STM32L151CB Manual page 91

STM32L151xx, STM32L152xx
Table 53. DAC characteristics (continued)
Symbol Parameter
Offset error temperature
(1)
dOffset/dT
coefficient (code 0x800)
(1)
Gain Gain error
Gain error temperature
(1)
dGain/dT
coefficient
(1)
TUE Total unadjusted error
Settling time (full scale: for
a 12-bit code transition
between the lowest and
t
SETTLING
the highest input codes till
DAC_OUT reaches final
value ±1LSB
Max frequency for a
correct DAC_OUT change
Update rate (95% of final value) with 1
LSB variation in the input
code
Wakeup time from off
state (setting the ENx bit
t
WAKEUP
in the DAC Control
(8)
register)
V supply rejection ratio
DDA
PSRR+
(static DC measurement)
1. Data based on characterization results.
Connected between DAC_OUT and V
2.
3. Difference between two consecutive codes - 1 LSB.
= 3.3V
V
DDA
= 3.0V
V
REF+
= 0 to 50 ° C
T
A
DAC output buffer OFF
= 3.3V
V
DDA
= 3.0V
V
REF+
= 0 to 50 ° C
T
A
DAC output buffer ON
≤ 50 pF, R
C
L
DAC output buffer ON
(7)
No R
LOAD
DAC output buffer OFF
= 3.3V
V
DDA
= 3.0V
V
REF+
= 0 to 50 ° C
T
A
DAC output buffer OFF
= 3.3V
V
DDA
= 3.0V
V
REF+
= 0 to 50 ° C
T
A
DAC output buffer ON
≤ 50 pF, R
C
L
DAC output buffer ON
No R
LOAD
DAC output buffer OFF
≤ 50 pF, R
C
L
≤ 50 pF, R
C
L
≤ 50 pF, R
C
L
≤ 50 pF, R
C
L
.
SSA
Conditions
≥ 5 kΩ
L
≤ 50 pF
, C
L
≥ 5 kΩ
L
≤ 50 pF
, C
L
≥ 5 kΩ
L
≥ 5 kΩ
L
≥ 5 kΩ
L
≥ 5 kΩ
L
Doc ID 17659 Rev 6
Electrical characteristics
Min Typ Max
-20 -10
0 20
+0.1 / -0.2% +0.2 / -0.5%
+0 / -0.2% +0 / -0.4%
-10 -2
-40 -8
12
8
7
9
-60
Unit
0
µV/°C
50
%
0
µV/°C
0
30
LSB
12
12 µs
1 Msps
15 µs
-35 dB
91/109