STM32L151xx, STM32L152xx
6.3.10
Absolute maximum ratings (electrical sensitivity)
Based on three different tests (ESD, LU) using specific measurement methods, the device is
stressed in order to determine its performance in terms of electrical sensitivity.
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts × (n+1) supply pins). This test
conforms to the JESD22-A114/C101 standard.
Table 35.
Symbol
V
ESD(HBM)
V
ESD(CDM)
1. Based on characterization results, not tested in production.
Static latch-up
Two complementary static tests are required on six parts to assess the latch-up
performance:
●
A supply overvoltage is applied to each power supply pin
●
A current injection is applied to each input, output and configurable I/O pin
These tests are compliant with EIA/JESD 78A IC latch-up standard.
Table 36.
Symbol
LU
6.3.11
I/O current injection characteristics
As a general rule, current injection to the I/O pins, due to external voltage below V
above V
DD
in order to give an indication of the robustness of the microcontroller in cases when
abnormal injection accidentally happens, susceptibility tests are performed on a sample
basis during device characterization.
ESD absolute maximum ratings
Ratings
Electrostatic discharge
voltage (human body model)
Electrostatic discharge
voltage (charge device model)
Electrical sensitivities
Parameter
Static latch-up class
(for standard pins) should be avoided during normal product operation. However,
Doc ID 17659 Rev 6
Conditions
= +25 °C, conforming
T
A
to JESD22-A114
= +25 °C, conforming
T
A
to JESD22-C101
Conditions
= +105 °C conforming to JESD78A
T
A
Electrical characteristics
Class Maximum value
2
2000
II
500
Class
II level A
SS
(1)
Unit
V
or
71/109
Need help?
Do you have a question about the STM32L151CB and is the answer not in the manual?
Questions and answers