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Model 6487 Reference Manual
Table 8-3 (cont.)
Limit test commands
Command
:SOURce2
:TTL <NDN> or <NRf>
:CLEar
[:IMMediate]
:AUTO <b>
:DELay <n>
:TTL4
:MODE <name>
:BSTate <ttl>
ARM
:SOURce <name>
INITiate
FORMat
:SOURce2 <name>
A) :FEED <name>
Name parameters:
•
•
SOURce2 Subsystem:
Specify 4-bit digital output clear pattern.
Clear I/O port (return output to TTL pattern):
Clear I/O port immediately.
Enable or disable auto-clear.
Specify delay (pulse-width) for pass/fail
pattern: 0 to 60 (sec).
Line 4 Mode configuration:
Select output line 4 mode: EOTest or BUSY.
Select active TTL level for busy: 1 (HI) or 0 (LO).
Trigger Subystem:
Arm Layer:
Select control source: NSTest, PSTest, BSTest, or
IMMediate.
Initiate one trigger cycle.
FORMat subsystem:
Select data format for reading output patterns:
<name> = ASCii
CALCulate1 — Limit tests will be performed on the result of a math calculation
(mX+b, m/x+b, or log).
SENSe — Limit tests will be performed on the input signal. Note however, that Rel
can be used on the result of a math calculation as well as the input signal. Limit
tests will be performed on the result of the Rel operation (see CALCulate1:NULL).
Details on relative, mX+b, m/X+b, and log are provided in
Limit Tests and Digital I/O
Description
Decimal format
HEXadecimal
Hexadecimal format
OCTal
Octal format
BINary
Binary format
8-19
Default Ref
15
B
OFF
0.0001
EOT
0
Sec 7
IMM
E
ASC
Section
5.
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