Agilent Technologies 89410A Service Manual page 67

e
Press the following keys in the order listed. Allow enough time for
each test to finish before pressing the next key.
]
[Return
[ ]
functional tests
[ sample RAM ]
[ digital filter ]
[ digital source ]
[ ]
ADC
[ ]
more
[ ]
analog source
[ input ]
[ calibration ]
A failure may cause the self tests to be very slow. Wait three
minute before assuming the analyzer is locked up.
f Determine the probable faulty assembly and next test or step by
comparing the self-test results to the following table.
If the analyzer's test log matches more than one entry in the table,
use the entry closest to the beginning of the table. The table lists
the probable faulty assembly or assemblies and troubleshooting
procedure to do before replacing an assembly. Assemblies are
listed in order of probable failure when more than one assembly
can cause the failure. The messages in the table include only the
parts of the failure messages that point to the assemblies failing.
For example, many of the failure messages give the channel
number ( 1 or 2 ), amplitude (mkr y: amplitude), and frequency
(mkr x: frequency) of the failure.
Troubleshooting the Analyzer
To troubleshoot self-test lockup failures
1-49