Test Points - NXP Semiconductors KITPF5030SKTEVM User Manual

NXP Semiconductors

4.4.2 Test points

Figure 8 shows test points that provide access to various signals to and from the boards.
Figure 8. Evaluation board test points
Table 13. Evaluation board test points description
Test point name
TP7
TP8
TP9
TP10
TP12
TP13
TP15
TP17
TP18
TP20
TP22
TP23
TP25
TP26
TP11, TP14, TP16, TP19, TP21
UM11854
User manual
Signal name Description
RSTB Reset pin (active low)
AMUX Analog multiplexer output
FS0B Fail-safe pin (active low)
INTB Interruption pin (active low)
PGOOD Power good pin (active high)
BUCK1 BUCK1 regulator output
BUCK2 BUCK2 regulator output
BUCK3 BUCK3 regulator output
LDO1 LDO1 regulator output
LDO2 LDO2 regulator output
VIN_5V VIN pin voltage
VIN_3V3 BUCK1/2_IN pin voltage
LDO1_MON LDO1_MON pin voltage
LDO2_MON LDO2_MON IN pin voltage
GND Ground
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Rev. 1 — 9 March 2023
KITPF5030SKTEVM programming board
UM11854
© 2023 NXP B.V. All rights reserved.
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