Test Points; Schematic Layout And Bill Of Materials - NXP Semiconductors KITFS23LDOEVM User Manual

UM11879
NXP Semiconductors
KITFS23LDOEVM evaluation board

4.4.13 Test points

The KITFS23LDOEVM board has several test points that facilitate access and measurements. This section
summarizes the available test points, how they are color-coded, and whether they are a test point component
with a part number or a pad test point with no part number.
Yellow: Test loop access to safety outputs and analog signals
Red: Test loop access for power supplies and CAN/LIN bus
Black: Test loop access to GND
Figure 11. KITFS23LDOEVM test points

4.4.14 Schematic layout and bill of materials

The board layout and bill of materials for the KITFS23LDOEVM evaluation board are available at https://
www.nxp.com/KITFS23LDOEVM
UM11879 All information provided in this document is subject to legal disclaimers. © 2023 NXP B.V. All rights reserved.
User manual Rev. 2 — 25 September 2023
19 / 73