Omron FZ3 Series User Manual page 46

Detecting defects and foreign materials
Method, objective
Detecting defects, contaminations
and spots on plain measurement
2
objects
Scratches, burrs
Inspection for minor scratches,
contamination and backgrounds
other than plain backgrounds
Count
Method, objective
Inspection for number of
pins
44 Processing Item Selection Guidelines
[Defect]
Effective for detection of contamination or spots on plain backgrounds.
Reference: "Processing Item List Manual", "Defect" (p.208)
[Defect]
Effective for exterior detection of scratches and burrs on parts.
Reference: "Processing Item List Manual", "Defect" (p.208)
[Fine Matching]
Effective for detection of minor defects and contamination on labels, etc.
Reference: "Processing Item List Manual", "Fine Matching" (p.224)
[Edge Pitch]
Effective when calculating the number of IC or connector pins.
Reference: "Processing Item List Manual", "Edge Pitch" (p.124)
References
References
FZ3 User's Manual