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Appendix C
PT2 - Ancillary System Data
Purpose:
Format:
Description:
>pt2
AMBTEMP =
VMVXDR
=
VMVDD1
=
VMVDC
=
PT3 - Receive Path
Purpose:
Format:
Description:
page C-28
This test displays the values for ambient temperature and the
VDD3, VDD1, and VDC voltages.
PT2
This test reads Timing Generator ADC channels 3 through 6
(see PT1 test for a description of each channel), performs a
conversion, and displays the values for ambient temperature,
VDD3, VDD1, and VDC. Here is a sample test with the con-
version factors for each ADC channel in brackets. NOTE:
These values may be "noisy" from sample-to-sample, but are
useful for detecting long-term trends.
29.1 Degrees C
6.5 Volts
5.0 Volts
56.8 Volts
This test displays receive path characteristics.
PT3
The test result is given as four nibbles (1 nibble = 4 bits).
Each nibble represents the result for a particular beam (most
significant nibble = beam 1, least significant nibble = beam 4).
In this example, we only describe which bit is set for beam 4
for a given failure type. This test has three parts:
: The ADFM pings without transmitting and displays the
Part 1
result of an auto-correlation function performed over 0 to 7
Lag periods. Ideally, we should see high correlation at near-
zero lags, and then see the correlation magnitude get smaller
quickly toward larger Lags. High correlation values at larger
Lags may indicate interference.
: The ADCP compares the RSSI value at high-gain vs.
Part 2
low-gain. This is not applicable to the ADFM. However, the
recorded RSSI value is applicable, and is compared to a fac-
tory threshold. High RSSI levels may also indicate interfer-
ence.
: The ADFM displays the Demodulator Hard-limiter
Part 3
bias values (DAC values. These values should be consistent
between beams and tests; however, some number of counts
deviation are allowed.
MGD Technologies, Inc.
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