Sun Microsystems Ultra 1 Creator Series Service Manual page 42

CODE EXAMPLE 3-1
0> Memory Stress Test
0> Test being relocated into Memory
0> Memory Address Line Test
0> Test being relocated into Memory
> Memory Address Line Test
0> Test being relocated into Memory
0>Forcing ECC Faults Test
0> ECC CE Pattern Test
0> ECC CE Check bit Test
0> ECC UE Pattern Test
0> ECC UE Check bit Test
0>SysIO Registers Test
0> SysIO Regsiter Initialization
0> IOMMU Registers and RAM Test
0> Streaming Buffer Registers and RAM Test
0> SBus Control and Config Registers Test
0> SysIO RAM Initialization
0>SysIO Functional Test
0> Mapping Selftest Enabling MMUs
0> Clear Interrupt Map and State Registers
0> SysIO Interrupts
0> SysIO Timers/Counters Test
0> IOMMU Virtual Address TLB Tag Compare Test
0> Streaming Buffer Flush Test
0> DMA Merge Buffer Test
0>CPU Speed
0> CPU 0 Running at XXX MHZ.
0>Ecache Stress Test
0> Ecache Stress Test
0>APC Test
0> APC Registers Tests Test
0> APC DVMA Test
0>Data Cache Test
0> Dcache Init
0> Dcache Enable Test
0> Dcache Functionality Test
0>FEPS Test
0> Parallel Port Registers Test
0> Parallel Port ID is: XxX
0> Parallel Port DVMA burst mode read/write Test
3-8 Ultra 1 Creator Series Service Manual • August 1996
Diag-level NVRAM Variable Set to Max (Continued)
Test