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Lattice Semiconductor
Test SMA Connections
General-purpose FPGA pins are available via SMA test connections. These connections are designed to permit
evaluations of several types of FPGA I/O buffers. The use of several termination schemes permits easy interfaces
for the type of buffer.
Table 15. Test SMA Connections for FPGA Pins (see Appendix A, Figure 16)
SMA
Designation
J37
J39
J38
LVDS_OUTP0
J40
LVDS_OUTN0
High Speed Test Point
DP2
(see Appendix A, Figure 15 and 16)
General-purpose FPGA pins are available via a differential test pad. These connections allow a high-impedance
probe to measure the performance of a coupled-differential output buffer pair.
Table 16. Differential I/O Test Point
Logic Analysis Connection
LA1
(see Appendix A, Figure 15 and 16)
Agilent single-ended probes designed for connection to the supplies Tyco/AMP's 2-767004-2 MICTOR connector
can be easily attached for signal bus analysis. Connections to general-purpose I/O pins are provided to the board
ready 38-pin MICTOR connector.
Table 17. Logic Analyzer Connections
MICTOR Pin
5
7
9
11
13
15
17
19
21
23
25
SCM25
Name
Signal
LVDS_INP
PR52A
LVDS_INN
PR52B
PR35A
PR35B
Probe
Probe
True
Compliment
AF30
AG30
Signal
900-Ball fpBGA
LA_CLK1
AJ1
LA_0
AG3
LA_1
AH2
LA_2
AD8
LA_3
AF7
LA_4
AJ7
LA_5
AJ8
LA_6
AH10
LA_7
AH11
LA_8
AF13
LA_9
AE14
Evaluation Board User's Guide
900-Ball
fpBGA
AB28
AC28
M29
N30
100-ohm
Differential Resistor
R274
MICTOR Pin
6
8
10
12
14
16
18
20
22
24
26
12
LatticeSC PCI Express x1
Termination
Termination
Description
Resistor(s)
None
None
100-ohm
R275
Differential
100-ohm
R275
Differential
Signal
900-Ball fpBGA
LA_CLK2
AF4
LA_16
AH13
LA_17
AK8
LA_18
AK9
LA_19
AH14
LA_20
AG14
LA_21
AK10
LA_22
AK11
LA_23
AH15
LA_24
AG15
LA_25
AH12
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