Leuze electronic MSI 400 Operating Instructions Manual page 85

Input current HIGH
Input current LOW
Input reverse current with ground
2
breakdown
Input capacity
Synchronous time
Number of inputs
Test outputs (X1, X2)
Number of outputs
Type of output
Output voltage HIGH
Output resistance LOW
Output current
Test pulse rate (test period)
Test pulse duration (test gap)
Load capacity
Line resistance
Safety outputs (Q1 to Q4)
Number of outputs
Type of output
Output voltage HIGH
Leakage current LOW
Output current
Total current I
tot
TU ≤ 45°C
TU ≤ 55 °C
TU ≤ 65°C
UL/CSA applications
Test pulse width
Test pulse rate
Load capacity
Leuze electronic
MSI-EM-IO84
2.4 to 3.8 mA
-2.5 to 2.1 mA
Max. 20 mA
1.5 kΩ effective reverse resistance for supply cur-
rent
10 nF
4 ms to 30 ms, configurable
8
2 (with 2 test signal generators)
PNP semi-conductor, short-circuit-proof, short-cir-
cuit-monitored (configurable)
15 to 30 V DC (max. 1.8 V drop to terminal A1 on
the controller module)
22 Ω ± 10%, voltage limited at about 10 mA
Max. 120 mA at a test output (X1 or X2)
Thus, a maximum of eight testable sensor cas-
cades are possible per module with a maximum
of 30 mA each.
The total current of the MSI 400 system is limited
to a maximum of 1.28 A. This corresponds, for
example, to a maximum of 32 testable sensor
cascades with 30 mA each plus 64 tactile
sensors at the inputs of expansion modules with
5 mA each.
1 to 25 Hz, configurable
1 to 100 ms, configurable
1 µF for test gap ≥ 4 ms
0.5 µF for test gap 1 ms
< 100 Ω
4
High-side MOSFET, short-circuit-proof
16 to 30 V DC (max. 0.8 V drop to terminal A1 on
this module)
3
Max. 0.1 mA
Max. 4.0 A
Max. 4.0 A
Max. 3.2 A
Max. 2.5 A
Max. 3.2 A
4
< 650 µs or deactivated
Max. 5 Hz
0.5 µF
5,6
MSI 400
Technical data
85