Table of Contents
Advertisement
W
R
X
S
AVE
UNNER
I
ERIES
Scan Histogra
m View
By enabling ScanHisto, a histogram corresponding to your searc
h criteria is superimposed on the overlay trace. In
the example below, the Rise 10-90% parameter measurement has been appli
ed, but only edges slower than
1.2 ns with a delta of 50 ps are accumulated in the histogram.
Another feature of WaveScan is that you can select a single bin of the histogram for analysis by t
ouching or
clicking it. A confirmation pop-up button then appears:
After Find Feature is confirmed, only the single bin of the histogram remains and information about the contents
of
the bin is displayed in the Filter Method area:
You can recall the original filter conditions by touching the Undo button at the top-right corner of the screen.
150
WRXi-OM-E Rev C
Advertisement
Table of Contents
