Confidential
Until : Indefinite
1.5.3 Adjacent defect judgment
Measurement
■
1)
Obtain the defect output by subtracted image for the R, Gr, B, and Gb signal at the accumulation
time of 1/16.25 seconds mode.
( The measurement of dark defects : 60°C, modulation defects : 25°C )
2)
Gr is the G pixel exists in GR line, and Gb is the G pixel exists in GB line.
Define of adjacent defects
■
:Defect pixel over the threshold
:Adjacent same color pixel
R pixel
R
Gr
R
Gb
B
Gb
R
Gr
R
Gb
B
Gb
R
Gr
R
Gb
B
Gb
R
Gr
R
Gb
B
Gb
R
Gr
R
Gb
B
Gb
Gb pixel
R
Gr
R
Gb
B
Gb
R
Gr
R
Gb
B
Gb
R
Gr
R
Gb
B
Gb
R
Gr
R
Gb
B
Gb
R
Gr
R
Gb
B
Gb
Define of dark adjacent defects
■
1) Define as the dark adjacent defects when there are 3 or more adjacent same color defects which
level is over the threshold. ( See the example diagram on next page. )
■
Define of modulation adjacent defects
1) Define as the modulation adjacent defects when there are 3 or more adjacent same color
defects which contrast is over the threshold. ( See the example diagram on next page. )
2) White defects and black defects are judged as the adjacent separately. ( ex. Even if white and
black defect is adjacent, these do not count as adjacent defects. )
2015/10/01
Enactment
Revision
Specifications
Gr
R
Gr
R
B
Gb
B
Gb
Gr
R
Gr
R
B
Gb
B
Gb
Gr
R
Gr
R
B
Gb
B
Gb
Gr
R
Gr
R
B
Gb
B
Gb
Gr
R
Gr
R
B
Gb
B
Gb
Gr
R
Gr
R
B
Gb
B
Gb
Gr
R
Gr
R
B
Gb
B
Gb
Gr
R
Gr
R
B
Gb
B
Gb
Gr
R
Gr
R
B
Gb
B
Gb
Gr
R
Gr
R
B
Gb
B
Gb
Gr pixel
Gr
R
Gr
R
B
Gb
B
Gb
Gr
R
Gr
R
B
Gb
B
Gb
Gr
R
Gr
R
B
Gb
B
Gb
Gr
R
Gr
R
B
Gb
B
Gb
Gr
R
Gr
R
B
Gb
B
Gb
B pixel
Gr
R
Gr
R
B
Gb
B
Gb
Gr
R
Gr
R
B
Gb
B
Gb
Gr
R
Gr
R
B
Gb
B
Gb
Gr
R
Gr
R
B
Gb
B
Gb
Gr
R
Gr
R
B
Gb
B
Gb
Generalplus Technology Inc.
Panasonic Semiconductor Solutions Co., Ltd.
MN34120PAJ
Total Page
Page
96
Gr
R
Gr
R
B
Gb
B
Gb
Gr
R
Gr
R
B
Gb
B
Gb
Gr
R
Gr
R
B
Gb
B
Gb
Gr
R
Gr
R
B
Gb
B
Gb
Gr
R
Gr
R
B
Gb
B
Gb
Gr
R
Gr
R
B
Gb
B
Gb
Gr
R
Gr
R
B
Gb
B
Gb
Gr
R
Gr
R
B
Gb
B
Gb
Gr
R
Gr
R
B
Gb
B
Gb
Gr
R
Gr
R
B
Gb
B
Gb
28
Gr
B
Gr
B
Gr
B
Gr
B
Gr
B
Gr
B
Gr
B
Gr
B
Gr
B
Gr
B