Defects In The Dark Condition; Modulation Defects - Panasonic MN34120PAJ Manual

Confidential
Until : Indefinite

1.4.1 Defects in the dark condition

Measure the sensor output signal of a measurement area shown in the Figure 1.4.1 below in the
light-shielded state at the standard imaging state and calculate the "dark defects" from the following
formula.
*1 : Active pixel area (pixel area not covered with aluminum except transient pixel area.)
Subtracted image (LSB) [ dark defects output ] = ( acquired image ) - ( smoothed image )
*2 : Dark defects is determined the count of single defects and adjacent defects. In addition, OB area in
Figure 1.4.1 is also tested.
OB area
3590

1.4.2 Modulation defects

Measure the sensor output signal of a measurement area shown in the Figure 1.4.2 below in the standard
illuminance at the standard imaging state and calculate the "modulation defects" from the following formula.
Subtracted image (LSB) [ modulation defects ] = ( acquired image ) - ( smoothed image )
*1 : White defects for plus defects output of subtracted image (LSB) , black defects for minus output.
Modulation defects contrast(%)=((defects:subtracted image) / (individual color channel sensitivity))×100
*2 : Modulation defects is determined the count of single defects and adjacent defects.
3590
2015/10/01
Enactment Revision
Specifications
4712
76 88
7 32 23 3488
3512
62
14
Figure 1.4.1 Measurement area of dark defects
4712
62
Figure 1.4.2 Measurement area of modulation defects
4632 18
88
3488
4632 18
14
Generalplus Technology Inc.
Panasonic Semiconductor Solutions Co., Ltd.
MN34120PAJ
Total Page
Page
21
96
Measurement area
Measurement area