Modulation Defects Standard - Panasonic MN34120PAJ Manual

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1.5.2 Modulation defects standard

Test condition ( Temperature : 25°C, Operating voltage : 1.2V/1.8V/3.3V )
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1) Obtain the defect output by subtracted image for R, Gr, B, and Gb signal under standard
illuminance in the standard imaging state at the accumulation time of 1/16.25 seconds mode.
2) Determine the defect contrast (%) for the R, Gr, B, and Gb signal at the standard imaging state.
3) Measure the number of single defects and adjacent defects.
4) See "1.4.2 Modulation defects" of page 21 for the area of counting defects.
Modulation defects standard
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Defect contrast (%)
X ＜ -20
-20 ≦ X < -10
-10 ≦ X ≦ 10
10 < X ≦ 20
1) Count the single defects which contrast is over ±10%.
2) Not count the single defects which contrast is under or equal ±10%.
3) Count the adjacent defects which contrast is over ±20%.
4) Not count the adjacent defects which contrast is under or equal ±20%.
Maximum allowable count standard
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Determine the total of dark defects, modulation white defects, and modulation black defects.
Treat as fail devices when defect counts are over allowable standard into the following formula.
nDW＋nB1＋nB2＋nW1＋nW2 ≦ 1024
2015/10/01
Enactment Revision
Specifications
Modulation white/black
20 < X
single defect counts
nB1
nB2
Not count
nW1
nW2
Generalplus Technology Inc.
MN34120PAJ
Total Page
96
Modulation white/black
adjacent defect counts
0
Not count
0
Panasonic Semiconductor Solutions Co., Ltd.
Page
27