GE L60 Instruction Manual page 589

APPENDIX B
Table B–10: MODBUS MEMORY MAP (Sheet 23 of 59)
ADDR REGISTER NAME
Phase Comparison Negative Sequence Current Rate of Change (ROC) (Read/Write Grouped Setting)
6080 Negative Sequence di/dt FD Function
6081 Negative Sequence di/dt FDL Pickup
6082 Negative Sequence di/dt FDL Seal-In
6083 Negative Sequence di/dt FDH Pickup
6084 Negative Sequence di/dt FDH Seal-In
6085 Negative Sequence di/dt FDH Supv
6087 Negative Sequence di/dt FD Block
6089 Negative Sequence di/dt FD Target
608A Negative Sequence di/dt FD Events
Phase Comparison Rate of Change of Positive-Sequence Current Settings (Read/Write Grouped Setting)
6092 Positive-Sequence Current Rate of Change (di/dt FD)
Function
6093 Positive-Sequence Current Rate of Change Low (di/dt FDL)
Pickup
6094 Positive-Sequence Current Rate of Change Low (di/dt FDL)
Seal-In
6095 Positive-Sequence Current Rate of Change High (di/dt
FDH) Pickup
6096 Positive-Sequence Current Rate of Change High (di/dt
FDH) Seal-In
6097 Positive-Sequence Current Rate of Change (di/dt FDH)
Supervision
6099 Positive-Sequence Current Rate of Change (di/dt FD)
Block
609B Positive-Sequence Current Rate of Change (di/dt FD)
Events
609C Positive-Sequence Current Rate of Change (di/dt FD)
Target
Phase Comparison Negative-Sequence Current Fault Detector (Read/Write Grouped Setting)
60A0 Negative-Sequence Current Fault Detector Function
60A1 Negative-Sequence Current Fault Detector Low Pickup
60A2 Negative-Sequence Current Fault Detector High Pickup
60A3 Negative-Sequence Current Fault Detector Block
60A5 Negative-Sequence Current Fault Detector Target
60A6 Negative-Sequence Current Fault Detector Events
Phase Comparison Positive-Sequence Current Fault Detector (Read/Write Grouped Setting)
60A8 Positive-Sequence Current Fault Detector Function
60A9 Positive-Sequence Current Fault Detector Low Pickup
60AA Positive-Sequence Current Fault Detector High Pickup
60AB Positive-Sequence Current Fault Detector Block
60AD Positive-Sequence Current Fault Detector Target
60AE Positive-Sequence Current Fault Detector Events
Phase Comparison Open Breaker Keying (Read/Write Grouped Setting)
60C0 Open Breaker Keying
60C1 Breaker 1 Auxiliary Contact
60C3 Breaker 1 Supervision Element
60C5 Breaker 2 Auxiliary Contact
60C7 Breaker 2 Supervision Element
60C9 Weak-Infeed Keying
60CB Supervision Element
60CD Infeed Pickup Delay
60CE Infeed Reset Delay
60CF Open Breaker Keying Pickup Delay
60D0 Open Breaker Keying Reset Delay
Phase Comparison Trip Scheme (Read/Write Grouped Setting)
60E0 87PC Function
GE Multilin
RANGE
0 to 1
0.01 to 5
0 to 10
0.01 to 5
0 to 10
0 to 4294967295
0 to 4294967295
0 to 2
0 to 1
0 to 1
0.01 to 5
0 to 10
0.01 to 5
0 to 10
0 to 4294967295
0 to 4294967295
0 to 1
0 to 2
0 to 1
0.02 to 5
0.05 to 15
0 to 4294967295
0 to 2
0 to 1
0 to 1
0.2 to 5
0.5 to 15
0 to 4294967295
0 to 2
0 to 1
0 to 1
0 to 4294967295
0 to 4294967295
0 to 4294967295
0 to 4294967295
0 to 4294967295
0 to 4294967295
0 to 50
0 to 50
0 to 50
0 to 50
0 to 1
L60 Line Phase Comparison System
B.4 MEMORY MAPPING
UNITS STEP FORMAT
--- 1 F102
pu 0.01 F001
s 0.001 F001
pu 0.01 F001
s 0.001 F001
--- 1 F300
--- 1 F300
--- 1 F109
--- 1 F102
--- 1 F102
pu 0.01 F001
s 0.001 F001
pu 0.01 F001
s 0.001 F001
--- 1 F300
--- 1 F300
--- 1 F102
--- 1 F109
--- 1 F102
pu 0.01 F001
pu 0.01 F001
--- 1 F300
--- 1 F109
--- 1 F102
--- 1 F102
pu 0.01 F001
pu 0.01 F001
--- 1 F300
--- 1 F109
--- 1 F102
--- 1 F102
--- 1 F300
--- 1 F300
--- 1 F300
--- 1 F300
--- 1 F300
--- 1 F300
s 0.001 F001
s 0.001 F001
s 0.001 F001
s 0.001 F001
--- 1 F102
DEFAULT
0 (Disabled)
10
600
50
B
200
0
0
0 (Self-reset)
0 (Disabled)
0 (Disabled)
10
600
50
200
0
0
0 (Disabled)
0 (Self-reset)
0 (Disabled)
10
50
0
0 (Self-reset)
0 (Disabled)
0 (Disabled)
50
75
0
0 (Self-reset)
0 (Disabled)
0 (Disabled)
0
0
0
0
0
0
0
35
0
0
0 (Disabled)
B-31