Memory Test - Toshiba T200 User Manual

3.5

Memory Test

To execute the Memory Test, select 2 from the DIAGNOSTIC TESTS menu and tap or press
Enter . Select a subtest to execute and tap or press Enter .
Subtest 01 RAM constant data (real mode)
This subtest writes constant data to conventional memory (0 to 640 KB), then
reads the new data and compares the result with original data.
Constant data is FFFFh, AAAAh, 5555h, and 0000h.
Subtest 02 RAM address pattern data (real mode)
This subtest writes address pattern data created by the exclusive-ORing
(XORing) to the address segment and address offset in conventional memory
(program end to 640 KB), then reads the new data and compares the result
with original data.
Subtest 03 RAM refresh (real mode)
This subtest writes a 256-byte unit of constant data to conventional memory (0
to 640 KB) then reads the new data and compares the result with original data.
Constant data is AAAAh and 5555h.
NOTE: There is a short delay between write and read operations, depending on
data size.
Subtest 04 Protected mode
This subtest writes constant data and address data to extended memory (from
100000h to the maximum address) then reads new data and compares the
result with original data.
3-10 T200, T200CS