Power-Up Self-Test Screen - DEC 4000 AXP Service Manual

Figure 2–9 Power-Up Self-Test Screen
VMS PAlcode Xn.nnX, OSF PAlcode Xn.nnX (CPU 1 of 1, DECchip
CPU
0
P
* Test in progress P Pass
A power-on self-test failure indicated under Storage A–E may represent
a failure of an embedded storage adapter (A–E) or failure of a drive on
the specified bus. Check the console event log for additional information
(Section 2.2.1).
Power-on self-tests failures indicated for all six Futurebus+ slots indicate
a failure of the Futurebus+ bridge on the I/O module. Replace the I/O
module in the event that all six Futurebus+ slots show failures.
When the power-up diagnostics are completed, a second screen similar to the
one shown in Figure 2–10 is displayed. This screen provides configuration
information for the system.
2–16 Power-On Diagnostics and System LEDs
17:33:56 Tuesday, January 26, 1993
Digital Equipment Corporation
TM
DEC 4000 AXP
\ Executing Power-Up Diagnostics
Memory Storage Net Futurebus+
1 0 1 2 3 A B C D E 0 1
P P P P P P P P
F Fail
Note
TM
21064)
1 2 3 4 5 6
- Not Present ? Sizing
LJ-02266-TI0