CODE EXAMPLE 3-1
{0}Test address up
{0}Test address down
{0}Test cell disturbance
{0}Test data reliability
{0}Test address line transitions
{0}* D-Cache TAGS
{0}Test address up
{0}Test address down
{0}Test cell disturbance
{0}Test data reliability
{0}Test address line transitions
{0}* D-Cache MicroTags
{0}Test address up
{0}Test address down
{0}Test cell disturbance
{0}Test data reliability
{0}Test address line transitions
{0}* D-Cache SnoopTags
{0}Test address up
{0}Test address down
{0}Test cell disturbance
{0}Test data reliability
3-14
Sun Blade 1000 and Sun Blade 2000 Service Manual • January 2002
diag-level Variable Set to max (2-Way CPU) (8 of 15)
{1}* D-Cache RAM
{1}Test address up
{1}Test address down
{1}Test cell disturbance
{1}Test data reliability
{1}Test address line transitions
{1}* D-Cache TAGS
{1}Test address up
{1}Test address down
{1}Test cell disturbance
{1}Test data reliability
{1}Test address line transitions
{1}* D-Cache MicroTags
{1}Test address up
{1}Test address down
{1}Test cell disturbance
{1}Test data reliability
{1}Test address line transitions
{1}* D-Cache SnoopTags
{1}Test address up
{1}Test address down
{1}Test cell disturbance
{1}Test data reliability