Sun Microsystems Sun Blade 1000 Service Manual page 101

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diag-level Variable Set to min (Single CPU) (Continued) (5 of 8)
CODE EXAMPLE 3-4
{0}Test address up
{0}Test address down
{0}Test cell disturbance
{0}* W-Cache TAGS
{0}Test address up
{0}Test address down
{0}Test cell disturbance
{0}* W-Cache SnoopTAGS
{0}Test address up
{0}Test address down
{0}Test cell disturbance
{0}* W-Cache Init
{0}* P-Cache RAM
{0}Test address up
{0}Test address down
{0}Test cell disturbance
{0}* P-Cache TAGS
{0}Test address up
{0}Test address down
{0}Test cell disturbance
{0}* P-Cache SnoopTags
{0}Test address up
{0}Test address down
{0}Test cell disturbance
{0}* P-Cache Status Data
{0}Test address up
{0}Test address down
{0}Test cell disturbance
{0}* P-Cache Init
{0}* FPU Registers
{0}Test walking 1/0 FPU registers
{0}Test register addressing
{0}* FSR
{0}Test walking 1 FSR register
{0}* Ecache RAM
{0}Test address up
{0}Test address down
{0}Test cell disturbance
{0}* Ecache Init
{0}* Correctable Ecache ECC Test
{0}* Uncorrectable Ecache ECC Test
{0}* Correctable SW Ecache ECC Test
{0}* Uncorrectable SW Ecache ECC Test
{0}* Correctable System ECC Test
Chapter 3 Power On Self-Test
3-47

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