Sun Microsystems Sun Blade 1000 Service Manual page 64

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CODE EXAMPLE 3-1
{0}Test walking 1 through the register
{0}* 4M DTLB RAM
{0}Test address up
{0}Test address down
{0}Test cell disturbance
{0}Test data reliability
{0}Test address line transitions
{0}* 8K DTLB RAM
{0}Test address up
{0}Test address down
{0}Test cell disturbance
{0}Test data reliability
{0}Test address line transitions
{0}* 4M DTLB TAG
{0}Test address up
{0}Test address down
{0}Test cell disturbance
{0}Test data reliability
{0}Test address line transitions
{0}* 8K DTLB TAG
{0}Test address up
{0}Test address down
3-10
Sun Blade 1000 and Sun Blade 2000 Service Manual • January 2002
diag-level Variable Set to max (2-Way CPU) (4 of 15)
{1}Test walking 1 through the register
{1}* 4M DTLB RAM
{1}Test address up
{1}Test address down
{1}Test cell disturbance
{1}Test data reliability
{1}Test address line transitions
{1}* 8K DTLB RAM
{1}Test address up
{1}Test address down
{1}Test cell disturbance
{1}Test data reliability
{1}Test address line transitions
{1}* 4M DTLB TAG
{1}Test address up
{1}Test address down
{1}Test cell disturbance
{1}Test data reliability
{1}Test address line transitions
{1}* 8K DTLB TAG
{1}Test address up
{1}Test address down

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