Pbit (Power Built-In Test) >Lm,Tb,2*<Cs><Cr - Safran LRF 7047 Manual

LRF 7047- Integrator Manual
6.7.2 PBIT (Power built-in test) >LM,Tb,2*<CS><CR>
This command initiates a routine of power built in test to assess the modules health.
The tests shall be initiated only in the normal operating mode and specific subsystems are initiated.
No laser radiation is emitted during this routine.
PBIT command and response
Command
Inputs
>LM,Tb,2*<CS><CR>
>LM,Tb,2*D9<0D>
Response
Outputs
>LM,Tb,name,test1,test2*<CS><CR>
>LM,Tb,PBIT,FF,FF*46<0D>
Parameters Value
name PBIT
test1 FF
test2 FF
testresult1 11111111
testresult2 11111111
Example of a PBIT command transaction:
Host  LRF Module
Command frame:
LRF Module  Host
Acknowledge frame:
Response frame:
Prompt:
914929_TML_LRF7047_en_Version B
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Description
Activates Power Built In Test routine.
Example.
Description
Response of LRF module to the PBIT request.
Example.
Description
Name.
Test result expressed in hexadecimal.
Test result expressed in hexadecimal.
(FF) Test result1 converted to binary (1 good, 0 error).
Bit 7: 3.3 V power supply (for dual power supply only).
Bit 6: +5 V (VBAT) under voltage test.
Bit 5: +5 V (VBAT) over voltage test.
Bit 4: Power supply for analog receiver unit under voltage test.
Bit 3: Power supply for analog receiver unit over voltage test.
Bit 2: Power supply for Rx-board under voltage test.
Bit 1: Power supply for Rx-board over voltage test.
Bit 0: Power supply for Tx-board under voltage test.
Test result2 converted to binary (1 good, 0 error).
(FF)
All Bits: Reserved.
Bit 0: GO/NOGO status (1  GO, 0  NO GO)
GO = all tests passed.
NO GO = at least one test failed.
Table 24: PBIT command
>LM,Tb,2*D9<0D>
>AC*84<0D>
>LM,Tb,PBIT,FE,FE*44<0D>
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Public: 04.2019
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