Hci Measurement Program; Introduction - Agilent Technologies Agilent E5250A User Manual

NOTE

HCI Measurement Program

This section explains how to use and modify the HCI measurement sample program.
This section consists of the following sections:
•

"Introduction"

• "Adding the Bias Source Control Routine"
• "Setting up the Measurement Environment"
• "Executing the Program"
• "Modifying the Program"
Introduction
The Hot-Carrier-Induced (HCI) degradation of MOSFET parameters is measured by
using Agilent 4155/4156 Semiconductor Parameter Analyzer, bias sources, and the
E5250A with the E5255A card.
Two HP BASIC language programs are used to perform the HCI measurement:
• HCI Test Program (SP_MUX_M) performs HCI degradation test according to
the JEDEC proceeding titled "A PROCEDURE FOR MEASURING HCI"
(29-JULY-93).
• Analysis Program (SP_MUX_A) determines the lifetime of MOSFET from the
data measured by HCI test program.
The SP_MUX_M program flow is shown in Table 9-5.
Table 9-5 also lists the files that are used to set up the 4155/4156 for each part of the
SP_MUX_M program. These setup files are stored on the E5250A Program Disk. So,
the program disk must be in the 4155/4156's disk drive when you execute the
program.
For details about a 4155/4156 setup file, GET the setup file and refer to the setup by
using the 4155/4156.
To Add the Bias Source Control Routine
The HCI measurement sample program (SP_MUX_M) requires bias sources. You
must modify or add a control routine for your bias sources to the program. Refer to
"Adding the Bias Source Control Routine" on page 9-23.
Agilent E5250A User's Guide, Edition 11
Executing Sample Programs
HCI Measurement Program
9-17