Reflected Light Infrared Observation Procedures - Olympus BXFM Instructions Manual

System microscope
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4-5 Reflected light infrared observation procedures

1
Turn ON the main switch.
2
Select the brightfield observation.
3
Bring the sample top surface into focus
with the visible wavelength.
4
Insert the band-pass filters for IR
(U-BP1100IR, U-BP1200IR, U-25).
5
Change to the camera light path
6
Engage the objective with the
magnification to use in the light path.
7
Bring the sample into focus.
40
Start observation.
Main switch of power supply
Brightfield/darkfield selector knob of the
reflected light illuminator
Coarse / Fine focusing knob of the BXFM
frame
Filter insertion slot of the reflected light
illuminator
Light path selection lever of the trinocular
tube
Nosepiece
Nosepiece
Coarse / Fine focusing knob of the BXFM
frame
· Combining the reflected polarizer slider for IR and the
NOTE
rotatable analyzer slider for IR (U-POIR, U-AN360IR) cuts
the reflection to the sample surface to acquire the image
with the higher resolution.
· Using the correction collar mechanism of the objective
reduces the aberration to acquire the bright image with the
high resolution.
(page 16)
(page 16)
(page 20)
(page 34)
(page 18)
(page 19)
(page 19)
(page 20)

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