Tracer Test - Keysight Technologies B1505A Handbook

Setting up a new Classic Test definition requires more knowledge as like the con-
nection between the device and SMUs of the B1505A and the function setup of the
SMUs as shown in figure 1-8 compared to the pre-defined Application Test. Gener-
ally speaking, the user can interact more directly to the SMU control in the case of
Classic Test compared to the Application Test which is somewhat black box to the
user until knowing the inside setup by sneaking in the Application Test definitions.
After you create a new Classic Test definition, you may have two choices; one is
continuously using that Classic Test definition or the other is converting the Classic
Test definition to a new Application Test definition. Creating a new Application Test
is effective if the new test definition is used by many people for relatively long pe-
riod because you can add more information to the user or operator through the Ap-
plication Test GUI and it can be considered as a simple record of the test definition.
Note: The Classic Test example setups used in the example application Test defini-
tions are included in the same example file set of the Application Test.
You can modify the measurement details such as user function, auto-analysis and
display items by using the example setups.
Tracer Test mode
Tracer Test mode shown as an example in figure 1-9 provides a real time feedback
in controlling the measurements like a curve tracer and it is useful as a debugging
tool for characterizing or quick check of a new or unknown devices. In the Tracer
Test mode, you can change the measurement parameters while the test is repeat-
edly executed, for example, the collector voltage of the Id-Vd sweep can be manu-
ally changed by rotating a knob of the B1505A like rotating a voltage dial of the
curve tracer.
Figure 1-8 shows an example of Tracer Test measurement example.
Figure 1-8. Example Tracer Test mode GUI.
13