Keysight Technologies B1505A Handbook page 43

3-1-1. Ic - Vce measurement
Measurement Parameters: General Ic-Vce characteristics
Application Test name: Ic-Vce(PowerBJT) (Ic-Vce characteristics)
Application Test setup name (My Favorite Setup -> Example_AT): Ic-Vce
Device used in the example: MJL4281AG
Connection inside the N1259A Test Fixture: Use figure 3-3 or 3-4
Application description:
Measures Ic-Vce characteristics. SMU pulse is used for both the Collector-Emitter
voltage output and the base current drive.
Ic-Vce measurement of this application test does not extract any specification data
of power BJT, but it provides a generic idea of the transistor behavior such as hFE
dependence of the collector current and the voltage.
Typical power BJT data or specification sheet starts from the general Ic-Vce charac-
teristics or hFE-Ic characteristics in graphical data section.
1. Starting from Application Test Library
1
2
3
5
a
b
Figure 3-5. Ic-Vce application test setup.
4
(PowerBJT)
1`. Starting from My Favorite Setup
Go to
5
4`
c
d
1`
2`
3`
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