Keysight Technologies B1505A Handbook page 44

Power device analyzer/curve tracer
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A. Measurement Procedure: Ic-Vce(Power BJT) Application Test,
- Starting from Application Test Library
This test approach starts measurements by using an Application Test Library, which
starts from the default setup parameters, and you have to customize the measure-
ment parameters depending on your requirements.
Setup and execute the test by following the next steps. The same instruction steps
are illustrated by the numbers on the "1. Starting from Application Test Library" side
of figure 3-5.
Step 1. Click the Application Test tab.
Step 2. Check the PowerBJT category.
Step 3,4. Select Ic-Vce(PowerBJT) (Click the Ic-Vce(PowerBJT) then click Select
Step 5. Set the test parameters shown in figure 3-5 to an appropriate one depending
Step 6.Make sure the device is properly selected as shown in the "Device used in
Step 7. The graph window pops up, and the measurement starts.
Step 8. You can see the Ic-Vce curve in figure 3-6.
Figure 3-6 plots the collector current Icollector in Y axis versus the collector voltage
Vcollector in X axis.
44
)
on your B1505A configuration and your test device.
The important check points are;
a. Base SMU setup
b. Set Ib sweep parameters
c. Collector SMU setup
d. Set Vc test conditions
the example" part or your selection.
Close the lid of N1259A test fixture.
Start the measurement. (Click the Single button
)

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