Figure 4-28. State Trace Specification With Sequence Terms; Figure 4-29. State Trace Specification With [Next To] Sequence Terms - HP 1630A Operating And Programming Manual

Model 1630A/D/G
State Measurements
to Tr .sce Spec ,f eat ,r,n_
__________ _
__________________-
--
1
1i_u- iest .srt on
Lahel ADDR DATA STRT
E:se
e on
=.tor
Figure 4-28. State Trace Specification With Sequence Terms
4. Move the cursor to one of the [then] fields on the State Trace Specification menu . Use the NEXT[] or
PREV[] key to select [next to]. When [next to] is selected, the analyzer must see the [next to] term
immediately following the previous term . If the [next to]term is not seen immediately afterthe first term,
the analyzer will look for the first term again until it is immediately followed by the [next to] term . For
example, in figure 4-29, all the [then] terms have been changed to [next to]. With this specification, the
analyzer must find [a], immediately followed by [b], immediately followed by [c], immediately followed
by [d]. The trace starts at term [d], and [d] will be the first state in the State Listing . If the State Trace
Specification is changed to [center] or [end] the trace on [next to] term [d], all the sequence terms will
be included in the State Listing, providing the storing [all states] field do not define store qualifiers .
Store qualifying is discussed later in this chapter.
NOTE
Notice that the occurrence field is not on the State Trace Specification menu when
the start, end, or center trace term is a [next to] term . The trace will always start,
center, or end the trace on the first occurrence of the term which makes the
occurrence count irrelevant .
;rate Trace Specific .tlon______-DELETE to re-- field________
trace made
Sequence restart. on
Label, RDDR DATA STAT
Base >
Count
Figure 4-29. State Trace Specification With [next to] Sequence Terms
4-23