Inspection By Individual Application; Defect - Omron ZFX-C10 User Manual

Inspection by Individual Application

Defect

Use this item to detect dirt, scratching, chipping, burrs, and other defects on plain measurement targets. The
extent of the defects at locations having the highest number of defects and their positions are output. The
number of locations where the extent of defects equals or exceeds the noise level also are output.
Setup
Note
Number of Defects
76
Setting Measurement Items
Measurement
The measurement region is automatically subdivided into
smaller sections to detect for changes in their respective
brightness (density). The density difference with the surround-
ing area is collected, parts having a large difference are
judged to be a defect, and the position information and extent
of the defects of the locations having the highest number of
defects are output.
Measurement region
Chipping and burrs on the outer periphery also can be detected.
The extent of the defects is calculated in subdivided
regions, and regions at or exceeding the defect
threshold are output as the number of defects.
Scratch
Burr
Chipping
Subdivision
ZFX-C User's Manual