Teledyne T3MIL50 User Manual page 11

Advanced
Temperature
Measurements
Drive Signals
Dry Circuit Testing
Automatic Testing
Applications
The T3MIL50/50X has a number of advanced
temperature functions that can be used with the optional
temperature probe, PT-100.
The temperature compensation function can extrapolate
what the resistance of a DUT will be at a desired
temperature, if the temperature coefficient of the DUT
and the resistance of the DUT at ambient temperature
are known.
The temperature conversion function can be used to
extrapolate what the temperature rise of a DUT will be at
specified resistance if the initial resistance, initial
temperature and the constant for the DUT are known.
The T3MIL50X can select a number of different drive
signals to suit a number of different measurement
scenarios, for example the Pulse setting can be used to
cancel the effects of thermoelectric EMF on the
measurement results.
Dry circuit testing allows the T3MIL50X to measure the
contact resistance of switches and connectors according
to the DIN IEC 512 and ASTM B539 standards. The
open circuit voltage will not exceed 20mV in this mode
to prevent the oxidization layer on metal switches and
connector points from breakdown.
The T3MIL50/50X has a handler interface designed for
automatic testing. The handler interface outputs the
status of PASS, FAIL, HI, LO, READY and EOT signals
and inputs a trigger control signal. Automatic testing is
used with the binning, compare and scan functions.
 Production testing for contact resistance of switches,
relays, connectors, cables and printed circuit boards
and other low resistance devices.
 Component testing of resistors, motors, fuses and
heating elements.
 Incoming inspection and quality assurance testing.
 Conductivity evaluation for product design.
GETTING STARTED
11