HP 3562A Service Manual page 422

MODEL 3562A
7-1 6 DIAGNOSTIC DESCRIPTIONS
The self-tests consist of approximately 40 different tests that are run either in groups or
individually to test a particular assembly, a function, or the entire instrument. The power-up
tests are executed on turn-on, and the rest of the self-tests are invoked by pressing soft
keys. This section describes the sequence of tests executed in groups and the SERVIC
TEST soft key tests. Refer to table 7-4, "Power-up Test Codes" and table 7-6, "TEST ALL
Messages" for a general description of the test result messages. For a detailed explanation
of test result messages, refer to the troubleshooting paragraph for the assembly failing.
A. Power-Up Tests
The power-up tests consist of two sets of tests, low-level and high-level. The low-level
tests exercise the A2 System CPU, the A3 Program ROM, the A8 Global RAM, the global
bus, and the system bus. Fault and pass codes for these assemblies are displayed using
the A2 System CPU test LEDs (A2 DS3, A2 DS4). The high-level tests exercise the A9 FFT,
A7 FPP, AS DGTL FLTR, and A6 D FL TR CONT assemblies. Faults on these assemblies
are displayed in the test log. The instrument performs a calibration if the power-up tests
pass. Refer to figure 7-12 for the power-up sequence.
7-58
FAULT ISOLATION