Show Results Summary - Sun Microsystems Ultra 20 M2 Service Manual

4.8

Show Results Summary

The summary lists the tests run and shows the results. Pass, Fail, or N/A (not
applicable) displays for each option.
TABLE 4-5
Some options might not appear when the Show Results Summary displays if they
are not applicable to your workstation's configuration.
TABLE 4-5
Option
Processor
Motherboard
Memory, Cache
Memory, and Video
Memory
Input Device
Mouse
Video
Multimedia
ATAPI Devices
lists all possible options that are available with the Tools and Drivers CD.
Show Results Summary
Description
This section shows the following tests conducted against the
processor: Core Processor Tests, AMD 64-Bit Core Tests, Math Co-
Processor Tests – Pentium Class FDIV and Pentium Class FIST,
MMX Operation, 3DNow! Operation, SSE Instruction Set, SSE2
Instruction Set, and MP Symmetry.
This section shows the following tests conducted against the
motherboard: DMA Controller Tests, System Timer Tests, Interrupt
Test, Keyboard Controller Tests, PCI Bus Tests, and CMOS
RAM/Clock Tests.
This section shows the following tests conducted against the various
types of memory: Inversion Test Tree, Progressive Inv. Test, Chaotic
Addressing Test, and Block Rotation Test.
This section shows the following tests conducted against the input
device: Verify Device, Keyboard Repeat, and Keyboard LEDs.
This section shows the following tests conducted against the mouse:
Buttons, Ballistics, Text Mode Positioning, Text Mode Area Redefine,
Graphics Mode Positions, Graphics Area Redefine, and Graphics
Cursor Redefine.
This section shows the following tests conducted against the video:
Color Purity Test, True Color Test, Alignment Test, LCD Test, and
Test Cord Test.
This section shows the following tests conducted against the
multimedia components: Internal Speaker Test, FM Synthesizer Test,
PCM Sample Test, CD/DVD Drive Read Test, CD/DVD Transfer
(KB/Sec), CD/DVD Transfer Rating, CD/DVD Drive Seek Test,
CD/DVD Seek Time (ms), CD/DVD Test Disk Read, and CD/DVD
Tray Test.
This section shows the following tests conducted against ATAPI
devices: Linear Read Test, Non-Destructive Write, and Random
Read/Write Test.
Chapter 4 Running Diagnostics 4-17