Agilent Technologies InfiniiVision 3000 X-Series Programmer's Manual page 1273

LIN triggering, 630
line frequency setting for current harmonics
analysis, 541
line glitch trigger source, 915
line number for TV trigger, 944
line terminator, 157
LINE trigger level, 903
LINE trigger source, 906
list of channel labels, 306
LISTer commands, 375
lister display, 377
lister time reference, 378
ln (natural logarithm) math function,
ln math function, 327
load utilization (CAN), 658
local lockout, 856
lock, 856
lock mask to signal, 507
lock, analog channel protection,
lockout message, 856
log (common logarithm) math function,
log math function, 327
logic level activity, 1049
long form, 1140
low frequency sine with glitch demo signal,
low pass filter math function, 327
low trigger level, 885
lower threshold, 433
lower threshold voltage for
measurement, 1066
lowercase characters in commands,
low-frequency reject filter, 904
low-level voltage, waveform generator,
low-pass filter cutoff frequency, 339
low-pass filter math function, 347
low-pass filter used to limit bandwidth, 264,
318
LRN (Learn Device Setup), 171
lsbfirst, 967
M
M1553 SEARch commands, 839
M1553 trigger commands, 731
M1553 trigger type, 737
magnify math function, 327, 347
magnitude of occurrence, 454
main sweep range, 873
main time base, 1093
main time base mode, 867
making measurements, 406
MAN option for probe sense, 1054,
manual cursor mode, 381
MARKer commands, 379
marker mode, 389
marker position, 390
marker readout, 1072, 1073
marker set for voltage measurement, 1078,
1079
marker sets start time, 1069
marker time, 1068
markers for delta voltage measurement,
Agilent InfiniiVision 3000 X-Series Oscilloscopes Programmer's Guide
markers track measurements,
markers, command overview,
markers, mode,
markers, time at start,
markers, time at stop,
markers, X delta,
markers, X1 position,
markers, X1Y1 source,
markers, X2 position,
markers, X2Y2 source,
markers, Y delta,
markers, Y1 position,
347 markers, Y2 position,
mask, 166, 180
mask command, bus,
mask statistics, reset,
mask test commands,
Mask Test Event Enable Register
861 (MTEenable),
mask test event event register,
347 Mask Test Event Event Register
(:MTERegister[:EVENt]), 203,
mask test run mode,
mask test termination conditions,
283 mask test, all channels,
mask test, enable/disable,
mask, delete,
mask, get as binary block data,
mask, load from binary block data,
mask, lock to signal,
1139 mask, recall,
mask, save, 615,
1031 masks, bind levels,
master summary status bit,
math filters, 327
math function, stop displaying,
math operators,
math transforms,
math visualizations,
MAV (Message Available), 165, 181,
maximum duration, 910, 922,
maximum position,
maximum range for zoomed window,
maximum scale for zoomed window,
maximum vertical value measurement,
maximum vertical value, time of, 467,
maximum waveform data length,
MEASure commands,
measure mask test failures,
measure overshoot,
measure period,
measure phase between channels,
1058
MEASure power commands,
measure preshoot,
measure start voltage,
measure stop voltage,
measure value at a specified time,
measure value at top of waveform,
measurement error,
measurement record,
measurement setup, 406,
measurement source,
1077
443
380
381
1073
1072
386
382
383
384
385
391
389
390
249
501
489
201
203
1122
508
508
494
506
505
504
504
507
601
616
516
183
198
326
326
327
183
923
868
874
875
459
1070
624
395
509
430
433
434
469
436
1078
1079
464
465
406
974
444
444
measurement statistics results, 438
measurement statistics, display on/off,
measurement trend math function, 327,
measurement window, 466
measurements, AC RMS, 423, 463
measurements, area, 409, 418
measurements, average value, 420,
measurements, base value, 421,
measurements, built-in, 61
measurements, burst width, 410
measurements, clear, 411, 1067
measurements, command overview,
measurements, counter, 412
measurements, DC RMS, 423, 463
measurements, definition setup,
measurements, delay, 416
measurements, duty cycle, 424
measurements, fall time, 425
measurements, falling edge count,
measurements, falling pulse count,
measurements, frequency, 426
measurements, how autoscale affects,
measurements, lower threshold level,
measurements, maximum vertical value,
measurements, maximum vertical value, time
of, 467, 1070
measurements, minimum vertical value,
measurements, minimum vertical value, time
of, 468, 1071
measurements, overshoot, 430
measurements, period, 433
measurements, phase, 434
measurements, preshoot, 436
measurements, pulse width, negative,
measurements, pulse width, positive,
measurements, ratio of AC RMS values,
measurements, rise time, 441
measurements, rising edge count,
measurements, rising pulse count,
measurements, show, 443
measurements, snapshot all, 408
measurements, source channel,
measurements, standard deviation,
measurements, start marker time,
measurements, stop marker time,
measurements, thresholds, 1069
measurements, time between start and stop
markers, 1068
measurements, time between trigger and
edge, 452
measurements, time between trigger and
vertical value, 454
measurements, time between trigger and
voltage level, 1074
measurements, upper threshold value,
measurements, vertical amplitude, 419,
measurements, vertical peak-to-peak, 422,
measurements, voltage difference,
memory setup, 179, 862
menu, system, 857
message available bit, 183
message available bit clear, 165
Index
447
347
457
458
406
414
427
428
193
1066
459
460
429
437
462
432
435
444
442
1072
1073
1076
456
461
1077
1273