Two-Channel Safety Application, Proof Test Interval 20 Years; Table 18: Safety Parameters For Two-Channel Safety Application - WAGO 750-666/000-003 Manual

WAGO-I/O-SYSTEM 750
750-666/000-003 4FDI/2FDO 24V/10A PROFIsafe V2 iPar
4.6.8.1

Two-channel Safety Application, Proof Test Interval 20 Years

Table 18: Safety parameters for two-channel safety application

Maximum Safety integrity Level
acc. EN 62061
Maximum safety integrity level
acc. IEC 61508
Maximum performance level
acc. EN ISO 13849-1
Proof test interval
Probability of failure PFD,
Proof test interval 20 years,
(low demand mode) (IEC 61508)
for one two-channel output
(fieldbus to output)
for one input pair
(input to fieldbus)
for two input pairs and one
two-channel output (intput to
fieldbus and fieldbus to output)
Probability of failure PFH,
Proof test interval 20 years,
(low demand mode) (IEC 61508)
for one two-channel output
(fieldbus to output)
for one input pair
(input to fieldbus)
for two input pairs and one
two-channel output (intput to
fieldbus and fieldbus to output)
Hardware fault tolerance HFT with two-
channel application
(IEC 61508/EN ISO 13849-1)
DC (diagnostic coverage level)
MTTF
d
(Mean Time To Failure dangerous)
Manual
Version 1.2.0, valid from HW/SW Version 01/01
Device Description
SIL3
SIL3
Cat. 4/PL e
20 years
1.69 * 10-4 (16.9% of all
PFD from 10-3 at SIL3)
1.14 * 10-4 (11.4% of all
PFD from 10-3 at SIL3)
1.7 * 10-4 (17% of all
PFD from 10-3 at SIL3)
-9
1.94 * 10 (1.94% of all
-7
PFH from 10 at SIL3)
1.31 * 10-9 (1.31% of all
PFH from 10-7 at SIL3)
1.95 * 10-9 (1.95% of all
PFH from 10-7 at SIL3)
1 (one error in the application does
not yet lead to a failure of the
safety equipment)
94%
410 years
37