Hitachi AP1 Data Book page 23

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Quality Control
Inspection on Material and
Parts for Semiconductor
Devices
Manufacturing Equipment,
Environment, Sub-material,
Worker Control
Inner Process
Quality Control
100% Inspection on
Appaarance and Elactrical
Characteristics
Sampling Inspection on
Appaarance and Electrical
Characteristics
Reliability Test
r- - - - - - - - - - - - - - - - ,
: Quality Information
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I Claim :
: Field Experience
I General Quality
Information I
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QUALITY ASSURANCE
Method
Lot Sampling,
Confirmation of
Quality Level
Confirmation of
Quality Level
Lot Sampling,
Confirmation of
Quality Level
Telting,
Inspection
Confirmation of
Quality Level, Lot
Sampling
Feedback of
Information
Fig~re
2 Flow Chart of Quality Control in Manufacturing Process
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