STMicroelectronics STM32F042F4 Manual page 80

Electrical characteristics
Equation 1: R
The formula above
allowed for an error below 1/4 of LSB. Here N = 12 (from 12-bit resolution).
T (cycles)
s
1.5
7.5
13.5
28.5
41.5
55.5
71.5
239.5
1. Guaranteed by design, not tested in production.
Symbol
ET Total unadjusted error
EO Offset error
EG Gain error
ED Differential linearity error
EL Integral linearity error
ET Total unadjusted error
EO Offset error
EG Gain error
ED Differential linearity error
EL Integral linearity error
ET Total unadjusted error
EO Offset error
EG Gain error
ED Differential linearity error
EL Integral linearity error
1. ADC DC accuracy values are measured after internal calibration.
80/117
max formula
AIN
R
AIN
(Equation 1) is used to determine the maximum external impedance
Table 55. R
Table 56. ADC accuracy
Parameter
f
f
V
T
f
f
V
T
f
f
V
T
T
S
<
--------------------------------------------------------------- - R
× × (
f C ln 2
ADC ADC
max for f = 14 MHz
AIN ADC
t (µs)
S
0.11
0.54
0.96
2.04
2.96
3.96
5.11
17.1
(1)(2)(3)
Test conditions
= 48 MHz,
PCLK
= 14 MHz, R < 10 kΩ
ADC AIN
= 3 V to 3.6 V
DDA
= 25 °C
A
= 48 MHz,
PCLK
= 14 MHz, R < 10 kΩ
ADC AIN
= 2.7 V to 3.6 V
DDA
-
= 40 to 105 °C
A
= 48 MHz,
PCLK
= 14 MHz, R < 10 kΩ
ADC AIN
= 2.4 V to 3.6 V
DDA
= 25 °C
A
DocID025832 Rev 5
STM32F042x4 STM32F042x6
–
ADC
N + 2
)
R max (kΩ)
AIN
0.4
5.9
11.4
25.2
37.2
50
NA
NA
Typ
±1.3
±1
±0.5
±0.7
±0.8
±3.3
±1.9
±2.8
±0.7
±1.2
±3.3
±1.9
±2.8
±0.7
±1.2
(1)
(4)
Max Unit
±2
±1.5
±1.5 LSB
±1
±1.5
±4
±2.8
±3 LSB
±1.3
±1.7
±4
±2.8
±3 LSB
±1.3
±1.7