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A3 Digital Storage, Circuit Description
A3 Digital Storage consists of three sections:
Input Section
Processor Section
CRT Driver Section
A3 Digital Storage, Troubleshooting
The troubleshooting information in this section is organized in the following manner.
"Digital Storage Failure Tests"
n
Description of two tests that can be performed to isolate failures in the Digital Storage
section.
Analysis of the results of the two Digital Storage Failure Tests, and a recommended
testing sequence of Digital Storage Assemblies.
"A3 Digital Storage Block Diagram"
n
Overall block diagram for Digital Storage Section, including mnemonics.
Digital Storage Failure Tests
1. INSTRUMENT CHECK LED
The left INSTR CHECK LED (CHECK LED I) remaining on after Instrument Preset is
pushed indicates that a bad bit was detected when the analyzer performed its self check
routine. This check routine writes and reads to the read-write memory (RAM) in Digital
Storage. To activate this test, press Instrument Preset.
2. DIGITAL STORAGE TEST PATTERN
The test pattern shown in Figure l-1 can be used to verify the existence of a failure. This
section receives the video and sweep signals, converts them to digital,
and transfers the data to the Processor Section.
and control for the data storage. The digital storage algorithm is
contained in read-only memory (ROM) in A3A6 Main Control.
This section, under control of the Processor Section, generates beam
control signals (X, Y, and 2) to display the memory data.
A3 1
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