Table of Contents
Advertisement
Blocks and Their Functions
Execution Times of FB252
Test Component
CPU
Operating system
comparison
RAM with STEP 5 objects
Onboard DI
Onboard DQ
Onboard interrupt DI
Onboard counters
External I/Os, DI
External I/Os, DQ
Processor RAM
Memory submodule
Power failure routine
Scan time monitor
Load voltage failure
routine
Logical program counter
Short-circuit test
Example:
Execution of Short-Circuit Test
Test digital input DI 32.3 via digital output DQ 33.2 for short circuit. You have
programmed this circuit with COM 95F. You will find the following entry in DB1:
KT
DQ 33.2
You store the condition for calling the short-circuit test in flag 10.0. Flag 10.6 = 1 and
flag 10.7 = 0.
9-20
Table 9-11. Execution Times of FB252
Parameter AUFT
00
H
01
H
Due to its long execution time, the test can be called
02
H
03
H
04
H
05
H
06
H
07
500 ms to 800 ms depending on configuration of LAN
H
08
500 ms to 800 ms depending on configuration of LAN
H
09
H
0A
H
0B
H
0C
H
0D
H
0E
H
0F
H
32.3;
(DQ 33.2 tests DI 32.3)
Execution Times
approx. 87 ms
approx. 20 s
only with parameter EINZ = 1
approx. 2.8 ms per STEP 5 statement
approx. 97 ms
approx. 230 ms
approx. 68 ms
95 ms for one counter, 190 ms for 2 counters
max. 5 ms
max. 5 ms
max. 5 ms
approx. 800 ms
max. 5 ms
max. 5 ms
For onboard DI:
For at least one external DI: 19 ms per test DQ
S5-95F
12 ms per test DQ
EWA 4NEB 812 6210-02
Advertisement
Table of Contents
