I/O Port Characteristics; Table 45. I/O Current Injection Susceptibility; Table 46. I/O Static Characteristics - STMicroelectronics STM32F031F4 Manual

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Electrical characteristics
Functional susceptibility to I/O current injection
While a simple application is executed on the device, the device is stressed by injecting
current into the I/O pins programmed in floating input mode. While current is injected into
the I/O pin, one at a time, the device is checked for functional failures.
The failure is indicated by an out of range parameter: ADC error above a certain limit (higher
than 5 LSB TUE), out of conventional limits of induced leakage current on adjacent pins (out
of the -5 µA/+0 µA range) or other functional failure (for example reset occurrence or
oscillator frequency deviation).
The characterization results are given in
Negative induced leakage current is caused by negative injection and positive induced
leakage current is caused by positive injection.
Symbol
I
INJ
6.3.14

I/O port characteristics

General input/output characteristics
Unless otherwise specified, the parameters given in
performed under the conditions summarized in
I/Os are designed as CMOS- and TTL-compliant (except BOOT0).
Symbol Parameter
Low level input
V
IL
voltage
High level input
V
IH
voltage
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Table 45. I/O current injection susceptibility

Injected current on BOOT0
Injected current on all FT and FTf pins
Injected current on all TTa, TC and RESET pins

Table 46. I/O static characteristics

Conditions
TC and TTa I/O
FT and FTf I/O
BOOT0
All I/Os except
BOOT0 pin
TC and TTa I/O
FT and FTf I/O
BOOT0
All I/Os except
BOOT0 pin
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Table 45.
Description
Table 46
Table 18: General operating
Min
-
-
-
-
0.445 V +0.398
DDIOx
0.5 V +0.2
DDIOx
0.2 V +0.95
DDIOx
0.7 V
DDIOx
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STM32F031x4 STM32F031x6
Functional
susceptibility
Negative
injection
–0
–5
–5
are derived from tests
Typ Max
- 0.3 V
DDIOx
- 0.475 V
DDIOx
- 0.3 V
DDIOx
- 0.3 V
(1)
-
(1)
-
(1)
-
-
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Unit
Positive
injection
NA
NA mA
+5
conditions. All
Unit
(1)
+0.07
(1)
–0.2
V
(1)
–0.3
DDIOx
-
-
V
-
-
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