Agilent Technologies B1500A Training Manual page 115

Semiconductor device analyzer
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Module 13
SPGU Control and Applications
Demo-S-NorFlash Endurance Test Setup
For the instrument connection shown in the previous pages, change the value as follows.
Pgate -> SPGU3
Gate -> SMU3
Psource -> SPGU2
Source -> SMU2
Pdrain -> SPGU4
Drain -> SMU4
Subs -> SMU1
Also, set a small TotalWriteAndEraseCycles value, for example 1000. If you set one million, you will have to
wait long time over several hours until the test is completed.
13-31

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