Agilent Technologies B1500A Training Manual page 89

High Voltage SPGU
Pulse Switch
Write
CLOSE
Gate
Pulse period
OPEN
Write Erase
The pulse switch is the built-in high speed analog switch to open/close the SPGU output for each
channel. This switch is used in the write/erase cycle of the NOR type flash memory cell test. This
dramatically improves throughput of the endurance test (write/erase lifetime reliability test). The
SPGU channel can output the drain pulse for the write operation and make the open status for the
erase operation in one pulse period.
CLOSE
Drain
SMU
Substrate
Source
SMU
CLOSE
13-5
SPGU Control and Applications
Erase
OPEN
Drain
SMU
Substrate
Gate
Source
SMU
Module 13