Agilent Technologies B1500A Training Manual page 8

Test Setup for Class Exercises
The Demo preset group contains the following test setup. The setup data are only examples
for the class exercises. The following table lists the test setup name in alphabetical order.
Test Setup Name
ALWG monitor
Charge Pumping 4T
0.1V step
CV-1MHz
Demo-S-NorFlash
Endurance
Fowler-Nordheim
GMMAX
GUMMEL
IDVD
IDVD-Pulse
Id-Vd
IDVG
IRVR
IV-res
LED
Parallel
PG monitor
RC-sampling-log
REKELV
R-sampl-neg-hold
Subthreshold
Trng C-f
Trng Cgg-Vg
Trng CV
Trng Id-Vd
511 kohm sampling measurement with SPGU ALWG output
MOSFET Icp-Vbase measurement
MOSFET Cgs-Vg measurement
MOSFET Endurance test
Fowler-Nordheim (FN) plot
MOSFET sqrt_Id-Vg, PEAK-Vg measurement
Bipolar transistor gummel plot
MOSFET Id-Vd measurement
MOSFET pulsed Id-Vd measurement
MOSFET Id-Vd measurement, Application Test
MOSFET Id-Vg measurement
511 kohm I-V measurement
511 kohm I-V measurement with SMU series resistor
LED I-V measurement
1 ohm I-V measurement, voltage force and current measurement
511 kohm sampling measurement with SPGU VPULSE output
RC sampling measurement, log sampling
Bipolar transistor Re measurement
511 kohm sampling measurement with negative hold time
MOSFET subthreshold measurement
Direct Control (C-f measurement)
Modifying application test definition using vector data
MOSFET C-V measurement
MOSFET Id-Vd measurement
Description