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Toshiba T1200 User Manual page 61

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3.3 SOftEST BAIlES
The following table shows subtest name of the test program.
TABLE
3-1
Subtest Names
#
TEST NAME
SUBTEST#
TEST ITEMS
1
SYSTEM
01
ROM checksum
02
HDDOFF-SW
01
RAM constant dati
02
RAM address pattern data
MEMORY
03
RAM refresh
2
04
Expansion bus
05
Backup RAM
06
EMS function
01
Pressed key disp!ay
3
KEYBOARD
02
Tenkey pad display
03
Pressed key code display
01
VRAM readlwnte
02
Character attributes
03
Character set
04
80*25 Charaeterdisplay
4
DISPLAY
05
320*200 Graphics display
06
640*200 Graphics display
07
Display page
08
• W
pattern display
09
Special attribute test
01
Sequential read
02
Sequential readlwrite
5
FDD
03
Randam address/data
04
Write specified address
05
Read specified address
0;
Ripple pattern
6
PRINTER
02
Function
03
Wraparound
01
Wrap around (channel-
1)
02
Wrap around (channel- 2)
03
Point to point (send)
7
ASYNC
04
Point to point (receive'
05
Card modem loopback
06
Card modem on-line test
07
Dial tester test
01
Sequential reid
02
Address uniquence
03
Randam address/dati
HOD
04
Cross talk .. peek
shift
8
05
Writelreadlcompare(CE)
06
Write specified address
07
Read specified address
08
ECC circuit (CE cvlinder'
REAL TIMER
01
Realtime
9
02
Real time carry
10
NDP
01
NDP
EXPANSION
01
Box wrap around
11
UNIT
02
Box mono video ram
3-5

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