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Memory tests
First row memory test
74
Hardware Maintenance Manual: xSeries 380
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There are three types of individual memory tests:
•
First Row Memory Test
•
Base Memory Test
•
Extended Memory Test
Each of these tests has different functions and is explained in the following sections.
The First Row Memory Test will test the first 64 MB of the first populated row of
memory configured. The scanning order for the first row of memory is described in
the following table.
Order
Row
1
C
2
D
3
E
4
F
5
8
6
9
7
A
8
B
9
4
10
5
11
6
12
7
13
0
14
1
15
2
16
3
Upon completion of the first row memory test, the memory testing continues with the
base memory test.
If the first row test fails, there are several possible failing cases. Two failing scenarios
are described in the following sections.
Case 1
The first row memory test encounters a MBE (Multi Bit Error) in the first populated
row of memory configured. Irrespective of the number of DIMMs populated in the
Board
Upper
Upper
Upper
Upper
Upper
Upper
Upper
Upper
Lower
Lower
Lower
Lower
Lower
Lower
Lower
Lower
DIMM
5-8
13-16
21-24
29-32
1-4
9-12
17-20
25-28
5-8
13-16
21-24
29-32
1-4
9-12
17-20
25-28