METREL MI 3122 Instruction Manual page 22

MI 3122 Smartec Z Line-Loop / RCD
Maximum RCD disconnection times differ in various standards.
The trip-out times defined in individual standards are listed below.
Trip-out times according to EN 61008 / EN 61009:
½I
General RCDs
t > 300 ms

(non-delayed)
Selective RCDs
t > 500 ms 130 ms < t

(time-delayed)
Trip-out times according to IEC 60364-4-41:
½I
General RCDs
t > 999 ms

(non-delayed)
Selective RCDs
t > 999 ms 130 ms < t

(time-delayed)
Trip-out times according to BS 7671:
General RCDs
t > 1999 ms

(non-delayed)
Selective RCDs
t > 1999 ms 130 ms < t

(time-delayed)
Trip-out times according to AS/NZS 3017
RCD type
I [mA]
N
 10
I
> 10  30
II
III > 30
> 30
IV
S
*)
Minimum test period for current of ½I
**)
Test current and measurement accuracy correspond to AS/NZS 3017 requirements.
Maximum test times related to selected test current for general (non-delayed) RCD
Standard
EN 61008 / EN 61009
IEC 60364-4-41
BS 7671
AS/NZS 3017 (I, II, III)
Maximum test times related to selected test current for selective (time-delayed) RCD
Standard
EN 61008 / EN 61009
IEC 60364-4-41
BS 7671
AS/NZS 3017 (IV)
*)
I
N
t < 300 ms

*)
I
N
t < 999 ms

*)
½I
N
t < 300 ms

*)
½I I
N
t t

40 ms
> 999 ms 300 ms
300 ms
500 ms
> 999 ms
130 ms
N
t < 150 ms

< 500 ms 60 ms < t

N
t < 150 ms

< 999 ms 60 ms < t

I
N
t < 150 ms

< 500 ms 60 ms < t

**)
:
2I 5I
N N
t t
  
40 ms 40 ms
150 ms 40 ms
150 ms 40 ms
200 ms 150 ms
60 ms 50 ms
, RCD shall not trip-out.
N
½I
N
300 ms 300 ms
1000 ms 1000 ms
2000 ms 300 ms
1000 ms 1000 ms
½I
N
500 ms 500 ms
1000 ms 1000 ms
2000 ms 500 ms
1000 ms 1000 ms
22
2I
N
t
< 200 ms 50 ms < t

2I
N
t
< 200 ms 50 ms < t

2I
N
t
< 200 ms 50 ms < t

N
Note
Maximum break time
Minimum non-actuating time
I 2I
N N
150 ms
150 ms
150 ms
150 ms
I 2I
N N
200 ms
200 ms
200 ms
200 ms
Settings
5I
N
< 40 ms

< 150 ms

5I
N
< 40 ms

< 150 ms

5I
N
< 40 ms

< 150 ms

5I
N
40 ms
40 ms
40 ms
40 ms
5I
N
150 ms
150 ms
150 ms
150 ms